Nash Dawood (N.N.Dawood@tees.ac.uk), University
of Teesside, United Kingdom, Scientific Chair
Walid Thabet (thabet@vt.edu), Virginia Tech, USA, Scientific Co-Chair
Miguel Dias (miguel.dias@iscte.pt), ISCTE, Portugal, Scientific Co-Chair
Rita Pannen (ccir@tees.ac.uk), CCIR, University of Teesside, United Kingdom,
Conference Secretary
A. Augusto de Sousa; FEUP/INESC; Portugal
Adérito Fernandes Marcos; UM/CCG; Portugal
Amin Hammad; Concordia Inst.; Canada
Brian Hobbs; University of Teesside; UKClive Fencott; University of Teesside; UK
Doug Bowman; Virginia Tech; USA
Enio Emanuel Ramos Russo; PUC-Rio; Brazil
Farzad Khosrowshahi; University of Salford; UK
Fátima Farinha; UALg / ICIST; Portugal
Henriqueta Nóvoa; FEUP; Portugal
João Mena de Matos; EDC; Netherlands
Joaquim Jorge; IST/INESC; Portugal
John Messner; Penn State University; USA
Joong-Min Kwak, Gyeongsang Nat.Univ.; Korea
José Carlos Teixeira; UC; Portugal
José Miguel Salles Dias; ISCTE/ADETTI; Portugal
José P. Duarte; IST; Portugal
Junichi Yagi; Shimizu Corporation; Japan
Kazuo Koga; Hazama Corporation; Japan
Khalid Naji; University of Qatar; Qatar
Kinya Tamaki; Aoyama Gakuin University; Japan
Koji Makanae; Miyagi University; Japan
Leen-Seok Khang; Gyeongsang Nat.Univ.; Korea
Muhd Zaimi Adb. Majid; Univ. Technology; Thailand
Paulo Dias; IEETA; Portugal
Peter Bonsma; TNO Bouw; Netherlands
Raymond Issa; University of Florida; USA
Ricardo Galli; UIB; Spain
Ricardo Gonçalves; Uninova; Portugal
Robert Amor; University of Auckland; N. Zealand
Robert Lipman; NIST; USA
Sabah Alkass; Concordia University; Canada
Seong-Yun Jeong; KICT; Korea
Serafim Castro; University of Teesside; UK
Shigeomi Nishigaki; Kick Ltd; Japan
Takashi Ito; Niigata System Techn.; Japan
Terrence Fernando; University of Salford; UK
Tulio Sulbaran; University of Southern Mississipi; USA
Vian Ahmed; University of Salford; UK
Vineet Kamat; University of Michigan; USA
Walid Tizani; University of Nottingham; UK
Yacine Rezgui; University of Salford; UK
Yoshio Maruyama; Hazama Corporation; Japan
* Presence to be confirmed